GB/T 41869.3-2024 光学和光子学 微透镜阵列 第3部分：光学特性测试方法

ICS

31.260

CCS

L51

中华人民共和国国家标准

GB/T41869.3—2024

光学和光子学微透镜阵列

第3部分：光学特性测试方法

Opticsandphotonics—Microlensarrays—

Part3:Testmethodsforopticalproperties

（ISO14880﹘3:2006，Opticsandphotonics—Microlensarrays—

Part3:Testmethodsforopticalpropertiesother

thanwavefrontaberrations，MOD）

2024-11-28发布2025-06-01实施

国家市场监督管理总局发布

国家标准化管理委员会

GB/T41869.3—2024

目次

前言

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Ⅲ

引言

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Ⅳ

1

范围

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1

2

规范性引用文件

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1

3

术语和定义

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1

4

波前像差测试

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1

5

焦距测试

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1

5.1

概述

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1

5.2

测试原理

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2

5.3

测试系统

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2

5.4

测试准备

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3

5.5

测试程序

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3

6

色差测量

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3

7

焦点位置均匀性测量

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4

7.1

概述

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4

7.2

测试原理

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4

7.3

测试系统

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5

7.4

测试程序

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5

8

测试结果的不确定度分析

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5

9

测试报告

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5

附录A（规范性）波前像差的测量

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7

附录B（规范性）共焦成像法测量有效焦距

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9

附录C（资料性）耦合效率和成像质量

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11

参考文献

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12

Ⅰ

GB/T41869.3—2024

前言

本文件按照GB/T1.1—2020《标准化工作导则第1部分：标准化文件的结构和起草规则》的规

定起草。

本文件是GB/T41869《光学和光子学微透镜阵列》的第3部分，GB/T41869已经发布了以下

部分：

—第1部分：术语；

—第2部分：波前像差的测试方法；

—第3部分：光学特性测试方法；

—第4部分：几何特性测试方法。

本文件修改采用ISO14880﹘3：2006《光学和光子学微透镜阵列第3部分：除波前像差外的光

学特性测试方法》。

本文件与ISO14880﹘3：2006相比做了下述结构调整：

—5.1对应ISO14880﹘3：2006的5.1和5.2.1；

—5.2对应ISO14880﹘3：2006的5.2.1；

—5.3对应ISO14880﹘3：2006的5.2.2；

—5.4对应ISO14880﹘3：2006的5.3；

—5.5对应ISO14880﹘3：2006的6.1和6.2；

—第6章对应ISO14880﹘3：2006的6.3；

—第7章对应ISO14880﹘3：2006的6.4和附录D；

—第8章对应ISO14880﹘3：2006的第7章和第8章。

本文件与ISO14880﹘3:2006的技术差异及其原因如下：

—用规范性引用的GB/T41869.1代替了ISO14880﹘1（见第3章），以适应我国的技术条件；

—删除了基板测试方法及其规范性引用的ISO10110﹘5（见ISO14880﹘3：2006的第4章），增加

了波前像差测试方法及其规范性引用的GB/T41869.2（见第4章），以适应我国的技术条件；

—更改了公式（2）（见第6章），以适应我国的技术条件、增加可操作性，也符合国际惯例；

—更改了附录A的性质（见附录A），与正文中规范性引用的方法相对应。

本文件做了下列编辑性改动：

—为与现有标准协调，将标准名称改为《光学和光子学微透镜阵列第3部分：光学特性测试

方法》；

—删除了附录A中A.1和A.3的注。

请注意本文件的某些内容可能涉及专利。本文件的发布机构不承担识别专利的责任。

本文件由中国机械工业联合会提出。

本文件由全国光学和光子学标准化技术委员会（SAC/TC103）归口。

本文件起草单位：中国兵器工业标准化研究所、电子科技大学、安徽光智科技有限公司、船舶信息

研究中心（中国船舶集团有限公司第七一四研究所）、福建福特科光电股份有限公司、浙江伟星光学股

份有限公司、江苏曙光光电有限公司、浙江水晶光电科技股份有限公司、艾普光学科技（厦门）有限公

司、宁波明星科技发展有限公司、武汉驿路通科技股份有限公司、深圳市深大极光科技股份有限公司。

本文件主要起草人：杜梦影、姜佳丽、尹士平、赵玥、朱元强、李斌成、汪松、吴建斌、

袁建奇、金利剑、马孟鸿、土克旭、张祥波、黄燕燕。

Ⅲ

GB/T41869.3—2024

引言

微透镜阵列是阵列光学器件中一类重要的光学元件，以单个透镜，两个或多个透镜阵列的形式，广

泛应用于三维显示、与阵列光辐射源和光探测器相关的耦合光学、增强液晶显示和光并行处理器元件。

随着科技不断进步，有必要制定一套技术内容与国际接轨的国家标准，这样既有利于推动我国微透

镜阵列行业规范有序发展，又能更好地促进相关领域的贸易、交流和技术合作。GB/T41869《光学和

光子学微透镜阵列》就是在此背景下起草制定的，微透镜阵列标准拟由以下4个部分组成。

—第1部分：术语。目的在于通过定义微透镜及其阵列的基本术语，促进微透镜阵列产品的应

用，有助于科研工作和行业从业者在共同理解的基础上交流概念。

—第2部分：波前像差的测试方法。目的在于通过规范波前像差的测试方法，明确微透镜的基本

性能特征。

—第3部分：光学特性测试方法。目的在于通过规范主要光学特性指标的测试方法，提高不同供

应方产品的兼容性和互换性，促进微透镜阵列技术进步。

—第4部分：几何特性测试方法。目的在于通过规范主要几何特性指标的测试方法，规范不同供

应商产品性能的一致性，拓展其应用领域。

Ⅳ

GB/T41869.3—2024

光学和光子学微透镜阵列

第3部分：光学特性测试方法

1范围

本文件规定了微透镜阵列中微透镜光学特性的测试原理、