GB/T 11682-2026 低本底α和/或β测量仪

ICS13.280

CCSF84

中华人民共和国国家标准

GB/T11682—2026

代替GB/T11682—2008

低本底α和/或β测量仪

Lowbackgroundalphaand/orbetameasuringinstruments

2026⁃09⁃28发布2027⁃04⁃01实施

国家市场监督管理总局

国家标准化管理委员会发布

GB/T11682—2026

目次

前言··························································································································Ⅲ

1范围·······················································································································1

2规范性引用文件········································································································1

3术语和定义··············································································································1

4技术要求·················································································································2

4.1仪器组成及功能外观要求······················································································2

4.2仪器的技术指标··································································································2

4.3环境适应性········································································································3

4.4电气安全要求·····································································································3

4.5电磁兼容性要求··································································································4

5试验方法·················································································································4

5.1参考条件和标准试验条件······················································································4

5.2参考源··············································································································4

5.3外观检查···········································································································4

5.4单位面积本底计数率试验······················································································4

5.5效率比试验········································································································5

5.6探测效率稳定性试验····························································································5

5.7串道比试验········································································································5

5.8环境适应性试验··································································································6

5.9电气安全试验·····································································································6

5.10电磁兼容性试验·································································································6

6检验规则·················································································································6

6.1出厂检验···········································································································6

6.2型式检验···········································································································6

6.3检验项目···········································································································6

7标志、包装、运输、贮存································································································7

7.1标志·················································································································7

7.2包装·················································································································7

7.3运输·················································································································7

7.4贮存·················································································································7

8随行文件·················································································································7

8.1说明书··············································································································7

8.2产品合格证········································································································8

Ⅰ

GB/T11682—2026

附录A（规范性）几何因子····························································································9

附录B（资料性）仪器分级···························································································10

参考文献····················································································································11

Ⅱ

GB/T11682—2026

前言

本文件按照GB/T1.1—2020《标准化工作导则第1部分：标准化文件的结构和起草规则》的规定

起草。

本文件代替GB/T11682—2008《低本底α和/或β测量仪》，与GB/T11682—2008相比，除结构

调整和编辑性改动外，主要技术变化如下：

——更改了术语“本底（计数）”“表面发射率”“探测效率”“效率比”的定义（见3.1、3.4~3.6，2008年

版的3.1、3.8、3.10和3.12）；

——更改了“（探测器）灵敏面积”“α/β串道比”“β/α串道比”的术语和定义（见3.2、3.7和3.8，2008年

版的3.16、3.13）；

——删除了术语“仪器本底”“空白样品”“空白样品本底”“本底计数”“本底计数率”“（放射性）活

度”“低本底α和/或β测量仪”“几何因子”“干扰辐射”“探测器窗”（见2008年版的3.2~3.7、

3.9、3.11、3.14和3.15）；

——增加了术语“单位面积本底计数率”“参考源”（见3.3、3.9）；

——更改了“仪器组成及功能外观要求”（见4.1，2008年版的4.1）；

——删除了“放射源”（见2008年版的4.2）；

——删除了“仪器的分级要求”（见2008年版的4.3）；

——增加了“仪器的技术指标”（见4.2）；

——更改了“环境适应性”（见4.3，2008年版的4.4）；

——更改了“电气安全要求”（见4.4，2008年版的4.5）；

——更改了“电磁兼容性要求”（见4.5，2008年版的4.6）；

——更改了“参考条件和标准试验条件”（见5.1，2008年版的5.1）；

——增加了“参考源”（见5.2）；

——增加了“外观检查”（见5.3）；

——更改了“单位面积本底计数率试验”（见5.4，2008年版的5.2）；

——更改了“效率比试验”（见5.5，2008年版的5.3）；

——更改了“探测效率稳定性试验”（见5.6，2008年版的5.4）；

——更改了“串道比试验”（见5.7，2008年版的5.5）；

——更改了“环境适应性试验”（见5.8，2008年版的5.6）；

——删除了“电源电压变化试验”（见2008年版的5.7）；

——更改了“电气安全试验”（见5.9，2008年版的5.8）；

——更改了“电磁兼容性试验”（见5.10，2008年版的5.9）；

——删除了“运输试验”（见2008年版的5.10）；

——更改了“检验规则”（见第6章，2008年版的第6章）；

——更改了“标志”（见7.1，2008年版的7.1）；

——更改了“运输”（见7.3，2008年版的7.3）；

——更改了“贮存”（见7.4，2008年版的7.4）；

——更改了“随行文件”（见第8章，2008年版的第8章）；

——更改了规范性附录A“几何因子”（见附录A，2008年版的附录A）。

请注意本文件的某些内容可能涉及专利。本文件的发布机构不承担识别专利的责任。

Ⅲ

GB/T11682—2026

本文件由全国核仪器仪表标准化技术委员会（SAC/TC30）提出并归口。

本文件起草单位：中核控制系统工程有限公司、中国核动力研究设计院、中国核电工程有限公司、

国家核安保技术中心、中国疾病预防控制中心辐射防护与核安全医学所、浙江省辐射环境监测站（生态

环境部辐射环境监测技术中心）、清华大学、北京市计量检测科学研究院、北京市疾病预防控制中心、

四川省疾病预防控制中心、贵州省疾病预防控制中心（贵州省预防医学科学院）、成都理工大学、中广核

研究院有限公司、中国船舶集团有限公司第七一九研究所、湖北方圆科学仪器股份有限公司、西安中核

核仪器股份有限公司。

本文件主要起草人：曹迎锋、刘海林、林德雨、刘超、王晓琼、张志雄、钟军、杨振雷、杨康、李佳睿、

李多宏、尹亮亮、谢雨晗、楼淑芬、刘长军、宫辉、赵贵坤、白斌、王欢、高艺莹、田祝娟、曾国强、单陈瑜、

代传波、张晶、贾伟强、黎建伟、花锋、陈笑屹、陈皓。

本文件及其所代替文件的历次版本发布情况为：

——1989年首次发布为GB/T11682—1989，2008年第一次修订；

——本次为第二次修订。

Ⅳ

GB/T11682—2026

低本底α和/或β测量仪

1范围

本文件规定了低本底α和/或β测量仪（以下简称“仪器”）的技术要求、检验规则、标志、包装、运

输、贮存、随行文件，描述了相应的试验方法。

本文件适用于测量弱α和/或β放射性活度或表面发射率的仪器和多用途仪器中测量弱α和/或β

放射性部分的设计、生产、验收环节。

本文件不适用于测量α或β能谱仪器的设计、生产、验收环节。

2规范性引用文件

下列文件中的内容通过文中的规范性引用而构成本文件必不可少的条款。其中，注日期的引用文

件，仅该日期对应的版本适用于本文件；不注日期的引用文件，其最新版本（包括所有的修改单）适用于

本文件。

GB/T8993核仪器环境条件与试验方法

GB/T17799.1电磁兼容通用标准居住、商业和轻工业环境中的抗扰度

GB/T19661.1核仪器及系统安全要求第1部分：通用要求

3术语和定义

下列术语和定义适用于本文件。

3.1

本底（计数）background（count）

在没有被测辐射源存在的条件下，仪器的固有计数。

[来源：GB/T4960.5—2025，10.43，有修改]

3.2

（探测器）灵敏面积sensitivesurfaceofadetector

探测器中对辐射灵敏并用于探测的面积。

3.3

单位面积本底计数率backgroundcountingrateperunitarea

灵敏面积上，单位面积、单位时间内的本底计数。

3.4

表面发射率surfaceemissionrate

单位时间内物体表面发射的给定类型的粒子数。

3.5

探测效率detectionefficiency

在规定的几何条件下，单位时间探测到的某类型粒子数与辐射源同类型粒子的表面发射率之比。

[来源：GB/T4960.6—2008，2.1.22]

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