GB/T 2423.27-2005 电工电子产品环境试验 第2部分：试验方法 试验Z/AMD：低温/低气压/湿热连续综合试验

ICS19.040

K04绷黔

中华人民共和国国家标准

GB/T2423.27-2005八EC60068-2-39:1976

代替GB/T2423.27-1981

电工电子产品环境试验

第2部分:试验方法试验Z/AMD

低温/低气压/湿热连续综合试验

Environmentaltestingforelectricandelectronicproducts-

Part2:Testsmethods-TestZ/AMD:Combinedsequentialcold,

lowairpressureanddampheattest

(IEC60068-2-39:1976,Basicenvironmentaltestingprocedures-

Part2:Tests-TestZ/AMD:Combinedsequentialcold，

lowairpressureanddampheattest,IDT)

2005-08-26发布2006-04-01实施

中华人民共和国国家质量监督检验检疫总局

中国国家标准化管理委员会发布

GB/T2423.27-2005/IEC60068-2-39:1976

目次

前言

目的

试验的一般说明，。。。。····，··，·························································，·，·。。，····，，，············……1

试验设备的说明···，·，。。。。。·。。·，，·，，，，，，················································、·。········，，，·········……1

试验程序··························，··，·······，··············································‘，。·。···，，，，··……1

预处理·······，，，····I

初始检测···············，·，，甲，，，··················，··，，···，一1

条件试验··········································，·。··，，····，，，································。···············……2

恢复···························，