译：GB/T 17574.10-2003 Semiconductor devices-Integrated circuits—Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories

译：GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part11:Section1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)

译：GB/T 18500.1-2001 Semiconductor devices—Integrated circuits Part 4:Interface integrated circuits Section 1:Blank detail specification for linear digital-to-analogue converters(DAC)

译：GB/T 18500.2-2001 Semiconductor devices—Integrated circuits—Part 4:Interface integrated circuits—Section 2:Blank detail specification for linear analogue-to-digital converters(ADC)

译：GB/T 5965-2000 Semiconductor devices—Integrated circuits—Part 2:Digital integrated circuits—Section one—Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays)

译：GB/T 17940-2000 Semiconductor devices—Integrated circuits—Part 3:Analogue integrated circuits

译：GB/T 17865-1999 Specification for measuring depth of focus and best focus

译：GB/T 17864-1999 CD Metrology procedures

译：GB/T 17866-1999 Guideline for programmed defect masks and benchmark procedures for sensitivity analysis of mask defect inspection systems

译：GB/T 17572-1998 Semiconductor devices—Integrated circuits Part 2:Digital integrated circuits Section four—Family specification for complementary MOS digital integrated circuits,scries 4000B and 4000UB

译：GB/T 9424-1998 Semiconductor devices lntegrated circuits Part 2:Digital integrated circuits Section five-Blank detail specification for complementary MOS digital integrated circuits,series 4000B and 4000UB

译：SJ/T 10843-1996 Detail specification for electronic components--Semiconductor integrated circuits--ECL Triple 2-3-2 input OR/NOR gates for Type CE10105 (Applicable for certification)

译：SJ/T 10840-1996 Detail specification for electronic components--Semiconductor integrated circuits--ECL Quad 2-input OR/NOR gates for Type CE10101 (Applicable for certification)

译：SJ/T 10815-1996 Detail specification for electronic components--Semiconductor integrated circuits--TTL 8-input NOR gates for Type CT1030 (Applicable for certification)

译：SJ/T 10990-1996 Detail specification for electronic components--Semiconductor TV integrated circuits--Picture chrominance signal processing circuits for Type CD5612CP

译：SJ/T 10987-1996 Detail specification for electronic components--Semiconductor TV integrated circuits--Horizontal and vertical sweep circuits for Type CD5435CP

译：SJ/T 11087-1996 Detail specification for electronic components—Semiconductor integrated circuits—Horizontal and vertical sweep curcuits and chrominance signal processing circuits for Type CD7698

译：SJ/T 10813-1996 Detail specification for electronic components--Semiconductor integrated circuits--TTL Dual 4-input NAND gates for Type CT1020 (Applicable for certification)

译：SJ/T 10847-1996 Detail specification for electronic components--Semiconductor integrated circuits--ECL Dual 3-input 3-output NOR gates for Type CE10111 (Applicable for certification)

译：SJ/T 10811-1996 Detail specification for electronic components--Semiconductor integrated circuits--TTL Quad 2-input AND gates for Type CT1008 (Applicable for certification)