译：SJ/Z 11353-2006 SJ/Z 11353-2006 Specification for Transfer of Integrated Circuit IP Kernels

译：SJ/Z 11358-2006 SJ/Z 11358-2006 IP core model classification for integrated circuits

译：SJ/Z 11361-2006 Integrated Circuit IP Core Protection Guidelines。

译：SJ/Z 11354-2006 SJ/Z 11354-2006 Specification for analog/mixed signal IP cores for integrated circuits

译：SJ/Z 11352-2006 SJ/Z 11352-2006 Specification for the exchange format and criteria of test data for integrated circuit IP cores

译：SJ/Z 11356-2006 On-chip bus attribute specification

译：SJ/Z 11355-2006 Integrated Circuit IP/SoC Function Verification Specification

译：GB/T 12750-2006 Semiconductor devices—Integrated circuits—Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits

译：GB/T 17574.10-2003 Semiconductor devices-Integrated circuits—Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories

译：GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part11:Section1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)

译：GB/T 18500.1-2001 Semiconductor devices—Integrated circuits Part 4:Interface integrated circuits Section 1:Blank detail specification for linear digital-to-analogue converters(DAC)

译：GB/T 18500.2-2001 Semiconductor devices—Integrated circuits—Part 4:Interface integrated circuits—Section 2:Blank detail specification for linear analogue-to-digital converters(ADC)

译：GB/T 5965-2000 Semiconductor devices—Integrated circuits—Part 2:Digital integrated circuits—Section one—Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays)

译：GB/T 17940-2000 Semiconductor devices—Integrated circuits—Part 3:Analogue integrated circuits

译：GB/T 17864-1999 CD Metrology procedures

译：GB/T 17865-1999 Specification for measuring depth of focus and best focus

译：GB/T 17866-1999 Guideline for programmed defect masks and benchmark procedures for sensitivity analysis of mask defect inspection systems

译：GB/T 17572-1998 Semiconductor devices—Integrated circuits Part 2:Digital integrated circuits Section four—Family specification for complementary MOS digital integrated circuits,scries 4000B and 4000UB

译：GB/T 9424-1998 Semiconductor devices lntegrated circuits Part 2:Digital integrated circuits Section five-Blank detail specification for complementary MOS digital integrated circuits,series 4000B and 4000UB

译：SJ/T 11087-1996 Detail specification for electronic components—Semiconductor integrated circuits—Horizontal and vertical sweep curcuits and chrominance signal processing circuits for Type CD7698